{ "items" : [
    { "id" : "http://webisa.webdatacommons.org/101977204"
      "properties" : {
        "http://www.w3.org/1999/02/22-rdf-syntax-ns#type" : [ "http://www.w3.org/ns/prov#Entity" ] ,
        "http://www.w3.org/ns/prov#value" : [ "More than 60 international participants attended, representing industries and organizations including industrial automation, aerospace, test and measurement, power and utility (Smart Grid), telecommunications, semiconductor manufacturing, academia, and government." ] ,
        "http://www.w3.org/ns/prov#wasQuotedFrom" : [ "nist.gov" ] } },

    { "id" : "http://webisa.webdatacommons.org/prov/283681139"
      "properties" : {
        "http://www.w3.org/ns/prov#wasDerivedFrom" : [ "http://webisa.webdatacommons.org/101977204"] } } }
