{ "items" : [
    { "id" : "http://webisa.webdatacommons.org/146388198"
      "properties" : {
        "http://www.w3.org/1999/02/22-rdf-syntax-ns#type" : [ "http://www.w3.org/ns/prov#Entity" ] ,
        "http://www.w3.org/ns/prov#value" : [ "Conventional techniques for utilizing scanning probe microscopes in combination with scanning electron microscopes have also presented the technical difficulty of adjusting positions and interchanging items such as the sample, or the probe and laser of the scanning probe microscopes, and the like, once the scanning probe microscope was sealed within the evacuated scanning electron microscope." ] ,
        "http://www.w3.org/ns/prov#wasQuotedFrom" : [ "google.fr" ] } },

    { "id" : "http://webisa.webdatacommons.org/prov/497682375"
      "properties" : {
        "http://www.w3.org/ns/prov#wasDerivedFrom" : [ "http://webisa.webdatacommons.org/146388198"] } } }
