{ "items" : [
    { "id" : "http://webisa.webdatacommons.org/198030298"
      "properties" : {
        "http://www.w3.org/1999/02/22-rdf-syntax-ns#type" : [ "http://www.w3.org/ns/prov#Entity" ] ,
        "http://www.w3.org/ns/prov#value" : [ "During test of a device, and especially a circuit, the execution of a test program for testing the device may result in the generation of a plurality of test events, as well as attributes for the test events (such as test results and other data items)." ] ,
        "http://www.w3.org/ns/prov#wasQuotedFrom" : [ "google.co.uk" ] } },

    { "id" : "http://webisa.webdatacommons.org/prov/117022165"
      "properties" : {
        "http://www.w3.org/ns/prov#wasDerivedFrom" : [ "http://webisa.webdatacommons.org/198030298"] } } }
