{ "items" : [
    { "id" : "http://webisa.webdatacommons.org/prov/231657694"
      "properties" : {
        "http://www.w3.org/ns/prov#wasDerivedFrom" : [ "http://webisa.webdatacommons.org/348247126" ] } },

    { "id" : "http://webisa.webdatacommons.org/348247126"
      "properties" : {
        "http://www.w3.org/1999/02/22-rdf-syntax-ns#type" : [ "http://www.w3.org/ns/prov#Entity" ] ,
        "http://www.w3.org/ns/prov#value" : [ "est pads on a semiconductor substrate having integrated circuitry for operability testing thereofUS5528539Sep 29, 1994Jun 18, 1996Micron Semiconductor, Inc.High speed global row redundancy systemUS5535165Jun 30, 1995Jul 9, 1996Cirrus Logic, Inc.Circuits, systems and methods for testing integrated circuit devices including logic and memory circuitryUS5594694Jul 28, 1995Jan 14, 1997Micron Quantum De" ] ,
        "http://www.w3.org/ns/prov#wasQuotedFrom" : [ "google.com" ] } },

    { "id" : "http://webisa.webdatacommons.org/prov/155985048"
      "properties" : {
        "http://www.w3.org/ns/prov#wasDerivedFrom" : [ "http://webisa.webdatacommons.org/348247126"] } } }
