<http://webisa.webdatacommons.org/138286129>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/prov#Entity> .
<http://webisa.webdatacommons.org/138286129>	<http://www.w3.org/ns/prov#wasQuotedFrom>	<google.com> .
<http://webisa.webdatacommons.org/prov/269407994>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/138286129> .
<http://webisa.webdatacommons.org/138286129>	<http://www.w3.org/ns/prov#value>	"This invention relates to methods and apparatus for electrical testing of printed circuit boards and more particularly to functional testing of high-speed digital printed circuit boards." .