<http://webisa.webdatacommons.org/prov/352237951>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/179653281> .
<http://webisa.webdatacommons.org/179653281>	<http://www.w3.org/ns/prov#wasQuotedFrom>	<advanced-optical.com> .
<http://webisa.webdatacommons.org/prov/337470252>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/179653281> .
<http://webisa.webdatacommons.org/179653281>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/prov#Entity> .
<http://webisa.webdatacommons.org/179653281>	<http://www.w3.org/ns/prov#value>	"Ellipsometry applies models of polarized light interaction with materials to measure parameters such as thickness and refractive index." .