<http://webisa.webdatacommons.org/186183975>	<http://www.w3.org/ns/prov#value>	"Additionally, groups of types of devices can also be arranged in the test circuit and accordingly contacted using one or more sets of contact pads." .
<http://webisa.webdatacommons.org/186183975>	<http://www.w3.org/ns/prov#wasQuotedFrom>	<google.com> .
<http://webisa.webdatacommons.org/prov/69607962>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/186183975> .
<http://webisa.webdatacommons.org/prov/123689661>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/186183975> .
<http://webisa.webdatacommons.org/186183975>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/prov#Entity> .