<http://webisa.webdatacommons.org/237293030>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/prov#Entity> .
<http://webisa.webdatacommons.org/237293030>	<http://www.w3.org/ns/prov#wasQuotedFrom>	<google.co.uk> .
<http://webisa.webdatacommons.org/prov/67177869>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/237293030> .
<http://webisa.webdatacommons.org/237293030>	<http://www.w3.org/ns/prov#value>	"Patterns and other information developed by analyzing defects detected may allow improved performance of the manufacturing process." .