<http://webisa.webdatacommons.org/292323109>	<http://www.w3.org/ns/prov#value>	"In addition, the above method could be used to test integrated circuits formed in semiconductor materials other than silicon, e.g. gallium arsenide." .
<http://webisa.webdatacommons.org/292323109>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/prov#Entity> .
<http://webisa.webdatacommons.org/292323109>	<http://www.w3.org/ns/prov#wasQuotedFrom>	<google.com> .
<http://webisa.webdatacommons.org/prov/60235805>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/292323109> .