<http://webisa.webdatacommons.org/300520795>	<http://www.w3.org/ns/prov#value>	"In flash memories according to the prior art, which forcibly drive charges with high write voltages up to 10 V through a barrier, the damage caused by writing is a technologically limiting factor." .
<http://webisa.webdatacommons.org/prov/391717086>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/300520795> .
<http://webisa.webdatacommons.org/300520795>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/prov#Entity> .
<http://webisa.webdatacommons.org/300520795>	<http://www.w3.org/ns/prov#wasQuotedFrom>	<freshpatents.com> .