<http://webisa.webdatacommons.org/336473400>	<http://www.w3.org/ns/prov#wasQuotedFrom>	<google.com> .
<http://webisa.webdatacommons.org/336473400>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/prov#Entity> .
<http://webisa.webdatacommons.org/prov/135529328>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/336473400> .
<http://webisa.webdatacommons.org/336473400>	<http://www.w3.org/ns/prov#value>	"As described above, the system and method in accordance with the invention may be used with various different types of substrates and is not limited to the optical inspection of any particular type of substrate." .
<http://webisa.webdatacommons.org/prov/134308389>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/336473400> .