<http://webisa.webdatacommons.org/380409055>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/prov#Entity> .
<http://webisa.webdatacommons.org/prov/436288983>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/380409055> .
<http://webisa.webdatacommons.org/380409055>	<http://www.w3.org/ns/prov#value>	"Taking into account the above and other problems inherent in the prior art probe cards, it is an object of the present invention to provide a probe card that, while exhibiting excellent durability and improved reliability, can enhance elastic deformability of individual conductive probes and accommodate positional errors between the probes and electrode pads of a target test object, thereby assuri" .
<http://webisa.webdatacommons.org/380409055>	<http://www.w3.org/ns/prov#wasQuotedFrom>	<google.com> .