<http://webisa.webdatacommons.org/prov/317516481>	<http://www.w3.org/ns/prov#wasDerivedFrom>	<http://webisa.webdatacommons.org/60053877> .
<http://webisa.webdatacommons.org/60053877>	<http://www.w3.org/ns/prov#wasQuotedFrom>	<google.de> .
<http://webisa.webdatacommons.org/60053877>	<http://www.w3.org/ns/prov#value>	"The present invention relates to test equipment and more particularly to equipment for probing, testing, burn-in, repairing, programming and binning of integrated circuits." .
<http://webisa.webdatacommons.org/60053877>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/prov#Entity> .