Co., Ltd.Detection of an end point of polishing a substrateUS700481723 ao???t 200228 f???vr. 2006Micron Technology, Inc.Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpiecesUS70082954 f???vr. 20037 mars 2006Applied Materials Inc.Substrate monitoring during chemical mechanical polishingUS700829618 juin 20037 mars 2006Applied Ma