peculiarizing processing section 4 b is described in more detail with reference to FIG. 2 and the test circuit production processing section 4 c and the load adjustment processing section 4 d are described in more detail with reference to FIGS. 3 and 4, respectively. [0213]FIG. 2 is a block diagram of the peculiarizing processing section 4 b according to the first embodiment of the present inventi