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  • ices, Inc.Method for determining the damage potential of the different types of wafer defectsUS6205239May 30, 1997Mar 20, 2001Texas Instruments IncorporatedSystem and method for circuit repairUS6272236Jul 18, 2000Aug 7, 2001Micron Technology, Inc.Inspection technique of photomaskUS6366687Jul 4, 1997Apr 2, 2002Applied Materials, Inc.Data converter apparatus and method particularly useful for a data
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