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  • ng integrated circuitry for operability testing thereofUS552853929 Sep 199418 Jun 1996Micron Semiconductor, Inc.High speed global row redundancy systemUS553516530 Jun 19959 Jul 1996Cirrus Logic, Inc.Circuits, systems and methods for testing integrated circuit devices including logic and memory circuitryUS559469428 Jul 199514 Jan 1997Micron Quantum Devices, Inc.Memory circuit with switch for select
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