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  • is adapted for executing a self-test, and integrated circuit containing such a device as an embedded static ram memoryUS5371748 *Mar 26, 1993Dec 6, 1994Vlsi Technology, Inc.Technique and apparatus for testing an electrically programmable ROM embedded among other digital circuitry on an IC chipUS5416784 *May 10, 1994May 16, 1995Sequoia SemiconductorBuilt-in self-test flip-flop with asynchronous in
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