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  • 996Micron Technology, Inc.Testing apparatus for engaging electrically conductive test pads on a semiconductor substrate having integrated circuitry for operability testing thereofUS5535165 *Jun 30, 1995Jul 9, 1996Cirrus Logic, Inc.Circuits, systems and methods for testing integrated circuit devices including logic and memory circuitryUS5594694 *Jul 28, 1995Jan 14, 1997Micron Quantum Devices, Inc.M
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