described in FIG. 2A, step 102; FIGS. 5A and 5B are examples of graphs to be used for analyzing the images of FIGS. 3, 4A, and 4B in the implementation of FIGS. 2A-2C; FIGS. 6A-6B, taken together, form a simplified flowchart illustration of a die-to-die, SNR filter based method for inspecting dark-field illuminated images in accordance with a preferred embodiment of the present invention; FIG. 7 i